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- Analog Component Test
- Power-On Test / Functional Test
- In-System Programming (Flash)
- Boundary Scan
- TestJet Vectorless Test
- Multi-Core High Throughput System
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Full In-Circuit Test Capability with In-System Programming and Functional Test in One System
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Analog In-Circuit Test
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Resistance (20mOhms to 20MOhms)
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Capacitance (1pF to 20mF)
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Inductance (1uH to 1000H)
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Diodes (Signal, Switching, Rectifier, LED, Zener)
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Transistors (Bipolar, FET, MOSFET, SCR, TRIAC)
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Opto-couplers
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Transformers (Polarity, Inductance, Resistance)
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Relays & Shorts & Opens
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MultiWriter In-System Programming
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Simultaneous programming of up to 384 devices in parallel
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High-signal integrity via short wire lengths is well-suited to today’s higher programming speeds
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Programming, byte-by-byte verification, chip erase, blank checking, CRC verification, device locking are all supported
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Unified hardware architecture eliminates problems with multi-vendor dongle-type solutions
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Power-On & Functional Test
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Voltage measurements up to 250 VAC
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Frequency, period, pulse-width measurements
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Current measurements
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AC and DC stimulus
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Higher-level bus protocols such as CAN, I2C, LIN, SPI
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Digital Test
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TestJet™ Vectorless Test
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Easy-to-use GUI Software
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Powerful debug environment
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Data manipulation
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Branches and loops
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Subroutines
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External program calls