In-Circuit Board Test
Get the fastest throughput for your panelized boards
Innovative ICT technologies to meet the changing needs of PCB test. Quality test systems, fixtures and programs designed for modern manufacturing.
Capabilities
- Analog Component Test
- Power-On Test / Functional Test
- In-System Programming (Flash)
- Boundary Scan
- TestJet Vectorless Test
- Multi-Core High Throughput System
Standard Features
- Full in-circuit test capability with In-System Programming and Functional Test in one system
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Analog In-Circuit Test
- Resistance (20mOhms to 20MOhms)
- Capacitance (1pF to 20mF)
- Inductance (1uH to 1000H)
- Diodes (Signal, Switching, Rectifier, LED, Zener)
- Transistors (Bipolar, FET, MOSFET, SCR, TRIAC)
- Opto-couplers
- Transformers (Polarity, Inductance, Resistance)
- Relays & Shorts & Opens
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MultiWriter In-System Programming
- Simultaneous programming of up to 384 devices in parallel
- High-signal integrity via short wire lengths is well-suited to today’s higher programming speeds
- Programming, byte-by-byte verification, chip erase, blank checking, CRC verification, device locking are all supported
- Unified hardware architecture eliminates problems with multi-vendor dongle-type solutions
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Power-On & Functional Test
- Voltage measurements up to 250 VAC
- Frequency, period, pulse-width measurements
- Current measurements
- AC and DC stimulus
- Higher-level bus protocols such as CAN, I2C, LIN, SPI
- Digital Test
- TestJet™ Vectorless Test
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Easy-to-use GUI Software
- Powerful debug environment
- Data manipulation
- Branches and loops
- Subroutines
- External program calls
System Options
Boundary Scan
CheckSum partners with vendors who provide boundary scan hardware and software tools.
For more information about boundary scan, see: See Boundary Scan Partners
Multi-Core High Throughput System
The high throughput option uses a multi-core test system architecture to achieve faster test times.